机读格式显示(MARC)
- 000 01474cam a2200325 a 4500
- 008 801027s1980 nyua b 101 0 eng
- 010 __ |a 80026509 //r905
- 040 __ |a DLC |c DLC |d DLC
- 050 00 |a QD921 |b .N38 1979
- 090 __ |a O78-53/NAT/(1979)
- 099 __ |a CAL 022000292288 |a CAL 022000327646 |a CAL 021999620691 |a CAL 022000879459
- 111 2_ |a NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods |d (1979 : |c Durham, England)
- 245 10 |a Characterization of crystal growth defects by X-ray methods : |b [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / |c edited by Brian K. Tanner and D. Keith Bowen.
- 260 __ |a New York, N.Y. : |b Plenum Press, |c c1980.
- 300 __ |a xxvi, 589 p. : |b ill. ; |c 26 cm.
- 490 0_ |a NATO advanced study institutes series : Series B, Physics ; |v v. 63
- 500 __ |a "Published in cooperation with NATO Scientific Affairs Division."
- 504 __ |a Includes bibliographical references and index.
- 650 _0 |a Crystals |x Defects |v Congresses.
- 650 _0 |a X-ray crystallography |v Congresses.
- 700 1_ |a Tanner, Brian Keith
- 700 1_ |a Bowen, D. Keith |q (David Keith), |d 1940-