机读格式显示(MARC)

• 000 01413cam 2200337 a 4500

• 000 1000103094

• 001 0000326084

• 005 20100105084811.0

• 008 851211s1985 nyua b 101 0 eng

• 010 __ |a 85238661

• 020 __ |c CNY12.60

• 040 __ |c EST

• 050 0_ |a TK7895.A8 |b A98 1985

• 082 0_ |a 621.381/028/7 |2 19

• 090 __ |a TP274-53/AN/(1985)

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 021999664417

• 111 2_ |a Autotestcon '85 |d (1985 : |c Uniondale, Long Island, N.Y.)

• 245 10 |a Proceedings : |b Autotestcon '85, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic Testing Conference, Long Island Marriott & Nassau Veterans Memorial Coliseum, Uniondale, New York / |c sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].

• 246 30 |a Autotestcon '85.

• 260 __ |a New York, NY : |b IEEE ; |a Piscataway, NJ : |b Copies from Order Dept., IEEE, |c c1985.

• 300 __ |a 472 p. : |b ill. ; |c 28 cm.

• 500 __ |a Cover title: Autotestcon '85.

• 500 __ |a "85CH2177-4."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 901 __022008001788

• 905 __ |a CAU |f TP274-53/AN/(1985) |b E0273220

• 907 __ |a CAU |f TP274-53/AN/(1985) |b E0273220

• 999 __ |t C |A zjyx |a 20080414 09:58:53 |I gxr |i 20100105 08:48:11 |G gxr |g 20100105 08:48:1