机读格式显示(MARC)

• 000 01342cam 2200289 a 4500

• 000 1000103058

• 001 0000326054

• 005 20100105154156.0

• 008 980915s1980 enka b 101 0 eng d

• 020 __ |a 0904999785 (session 1) : |c CNY3.30

• 040 __ |a BUPTL |d SCT |c BUPT

• 090 __ |a TP274-53/MCC/(1980)/V.1

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 021999652319 |a CAL 021999624173 |a CAL 021999652321 |a CAL 022000332713

• 110 2_ |a Metropole Covention Centre |d (1980)

• 245 10 |a Automatic testing 80 : |b proceedings of AUTOMATIC TESTING '80 Conference, 23-25 September 1980. |n session 1. |p Production testing and testing of PCBs and components / |c supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the Journals TEST and NEW ELECTRONICS.

• 260 __ |a Buckingham, Bucks, England : |b Network, |c 1980.

• 300 __ |a 213 p. : |b ill. ; |c 28 cm.

• 500 __ |a A joint IERE/NETWORK conference.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Instituteion of Electronic and Radio Engineers.

• 710 2_ |a NETWORK (Organization).

• 901 __022008001756

• 905 __ |a CAU |f TP274-53/MCC/(1980)/V.1 |b E0273209

• 907 __ |a CAU |f TP274-53/MCC/(1980)/V.1 |b E0273209

• 999 __ |t C |A zjyx |a 20080411 10:57:04 |I gxr |i 20100105 15:41:56 |G gxr |g 20100106 08:32:0