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MARC状态:已编 文献类型:西文图书 浏览次数:88

题名/责任者:
Semiconductor devices and integrated circuits / International Electrotechnical Commission, ISO.
出版发行项:
[Genève, Suisse : International Electrotechnical Commission, ISO, n.d.]
载体形态项:
3 v. : ill. ; 29 cm.
附加非控制题名:
Mechanical standardization of semiconductor devices.
附加非控制题名:
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods.
附加非控制题名:
Letter symbols for semiconductor devices and integrated microcircuits.
丛编说明:
Its Publication ; 147, 148, 191
丛编统一题名:
Publication (International Electrotechnical Commission) ; 147, 191.
团体责任者:
International Electrotechnical Commission.
论题主题:
Semiconductors-Standards.
论题主题:
Integrated circuits-Standards.
中图法分类号:
TM-65
中图法分类号:
TN303-65
一般附注:
Cover title.
内容附注:
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -- Letter symbols for semiconductor devices and integrated microcircuits -- Mechanical standardization of semiconductor devices.
语种附注:
German and English.
随书光盘:
全部MARC细节信息>>
索书号 条码号 年卷期 馆藏地 书刊状态
TM-65/IEC/V.147/V.3 B0001388  v.3 东5层4区      可借
TM-65/IEC/V.147/V.2 B0001387  v.2 东5层4区      可借
TM-65/IEC/V.147/V.1 B0001386  v.1 东5层4区      可借
TM-65/IEC/V.147 E0274531  pt.2 东5层4区      非可借
TM-65/IEC/V.147 E0274530  pt.1 东5层4区      非可借
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