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题名/责任者:

Autotestcon '83 : November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas / sponsored by IEEE ... [et. al.]. ; Participating Society, AIAA Support System, IEEE Reliability society.

出版发行项:

New York, NY : Institute of Electrical and Electronics Engineers , c1983.

载体形态项:

477 p. : ill. ; 27 cm.

会议名称:

Autotestcon '83 (1983 : Fort Worth, Tex.)

附加团体名称:

Institute of Electrical and Electronics Engineers.

论题主题:

Automatic checkout equipment-Congresses.

中图法分类号:

TP274-53

中图法分类号:

TP206

一般附注:

At head of title: New horizons in automatic testing.

一般附注:

"83CH1968-7."

书目附注:

Includes bibliographical references and index.

豆瓣简介：

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