MARC状态：已编 文献类型：西文图书 浏览次数：76
- 题名/责任者:
- Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
- 出版发行项:
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.
- ISBN:
- 089252765X (pbk.) :
- 载体形态项:
- vi, 256 p. : ill. ; 28 cm.
- 附加个人名称:
- Chen, Michael J. W.
- 附加个人名称:
- Thibadeau, Robert.
- 论题主题:
- Engineering inspection-Automation-Congresses.
- 论题主题:
- Quality control-Optical methods-Congresses.
- 中图法分类号:
- TP274-53
- 书目附注:
- Includes bibliographical references and index.
- 随书光盘:
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