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题名/责任者:

Testability of VLSI leakage faults in CMOS / Yashwant K.Malalya and Stephen Y.H.Su ; State University of New York at Binghamton.

出版发行项:

[Grifiss Air Force Base, N.Y. : Rome Air Development Center], 1983.

载体形态项:

iii, 91 p. : ill. ; 26 cm.

个人责任者:

Malaiya, Y. K.

附加个人名称:

Su,Stephen Y. H.

附加团体名称:

State University of New York at Binghamton.

论题主题:

Leakage(Electrical)

论题主题:

Integrated circuits.

论题主题:

Electrical and Electronic Equipment.

论题主题:

Test Facilities, Equipment and Methods.

中图法分类号:

TN47

一般附注:

"RADC-TR-83-202."

书目附注:

Includes bibliographical references.

报告附注:

Final technical report (September 1983)

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