- 题名/责任者:
- International Test Conference : proceedings : the three faces of test : design, characterization, production / sponsored by the IEEE Computer Society Test Technology Committee, IEEE Philadelphia Section.
- 出版发行项:
- Silver Spring, Md. : IEEE Computer Society Pr., c1984.
- ISBN:
- 0818605480
- 载体形态项:
- xxxi, 885 p. : ill. ; 28 cm.
- 会议名称:
- International Test Conference (1984)
- 附加团体名称:
- IEEE Computer Society. Test Technology Committee.
- 附加团体名称:
- Institute of Electrical and Electronics Engineers. Philadelphia Section.
- 论题主题:
- Integrated circuits-Testing-Congresses.
- 论题主题:
- Automatic checkout equipment-Congresses.
- 中图法分类号:
- TB22-53
- 书目附注:
- Includes bibliographical references and index.
- 随书光盘:
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